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SAGAR, KRIPA

Overview

Summary

Examiner Ninja's Dataset

121 Total Apps
94 Issued
27 Abandoned
0 Pending

Allowance Rates

Overall Allowance Rate

Likelihood of Allowance Based on Examiner's Full USPTO Tenure
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate Before First Final Rejection

Likelihood of Early Allowance
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate After First Final Rejection

Likelihood of Allowance After RCE's, etc.
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Allowance Rates

Click Legend Items to Filter
About this graph

Compare the examiner's allowance rate with the overall allowance rate of the examiner's art unit and the overall allowance rate of the USPTO. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Strategies

Interviews

Allowance Rate With No Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Interview

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Interview Allowance Rates

About this graph

Compare the examiner's allowance rates with and without interviews with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Interviews

About this graph

Compare the examiner's relative benefit of receiving an interview with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Appeals

Allowance Rate With No Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Appeal

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Appeal Allowance Rates

About this graph

Compare the examiner's allowance rates with and without appeals with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Appeals

About this graph

Compare the examiner's relative benefit of receiving an appeal with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

RCEs

Allowance Rate With No RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of RCE

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative RCE Allowance Rates

About this graph

Compare the examiner's allowance rates with and without RCEs with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of RCEs

About this graph

Compare the examiner's relative benefit of obtaining an RCE with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

History

Tenure

Applications Assigned To Examiner

By Filing Year and Current Application Status
About this graph

Shows all filed applications assigned to this examiner, broken down by filing year and the current status of the applications (issued, abandoned, or pending).

Workload

Recently Published Applications

App No. Title Filing Date Status
10686723 Manufacturing Method of Photomask and Photomask Oct. 17, 2003 Patented Case
10671666 Electron Device Manufacturing Method, a Pattern Forming Method, and a Photomask Used for Those Methods Sep. 29, 2003 Patented Case
10420593 Method to Form Reduced Dimension Pattern With Good Edge Roughness Apr. 22, 2003 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
10414572 Anti-Charging Layer for Beam Lithography and Mask Fabrication Apr. 15, 2003 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
10406438 Method for Manufacturing Master Substrate Used for Manufacturing Grooved Molding Substrate, Method for Manufacturing Stamper for Manufacturing Grooved Molding Substrate, Method for Manufacturing Grooved Molding Substrate, Grooved Molding Substrate, Memory Medium, M Apr. 04, 2003 Patented Case
10400860 Method of Forming Resist Pattern Mar. 27, 2003 Patented Case
10391310 Methods of Forming Patterns Across Photoresist and Methods of Forming Radiation-Patterning Tools Mar. 17, 2003 Patented Case
10388288 Method of Producing Pattern-Formed Structure and Photomask Used in the Same Mar. 13, 2003 Patented Case
10387753 Method of Producing Pattern-Formed Structure and Photomask Used in the Same Mar. 13, 2003 Patented Case
10305002 Two-Exposure Phase Shift Photolithography With Improved Inter-Feature Separation Nov. 27, 2002 Patented Case

Timings

Timings

Examiner Timings

Average Number of Days Until...
499 First Rejection
692 First Final Rejection
713 Abandonment
939 Issue

Art Unit Timings (1756)

Average Number of Days Until...
612 First Rejection
883 First Final Rejection
1035 Abandonment
974 Issue

USPTO Timings

Average Number of Days Until...
695 First Rejection
947 First Final Rejection
1113 Abandonment
1104 Issue

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