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ROMAN, ANGEL

Overview

Summary

Examiner Ninja's Dataset

632 Total Apps
470 Issued
101 Abandoned
61 Pending

Allowance Rates

Overall Allowance Rate

Likelihood of Allowance Based on Examiner's Full USPTO Tenure
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate Before First Final Rejection

Likelihood of Early Allowance
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate After First Final Rejection

Likelihood of Allowance After RCE's, etc.
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Allowance Rates

Click Legend Items to Filter
About this graph

Compare the examiner's allowance rate with the overall allowance rate of the examiner's art unit and the overall allowance rate of the USPTO. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Strategies

Interviews

Allowance Rate With No Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Interview

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Interview Allowance Rates

About this graph

Compare the examiner's allowance rates with and without interviews with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Interviews

About this graph

Compare the examiner's relative benefit of receiving an interview with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Appeals

Allowance Rate With No Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Appeal

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Appeal Allowance Rates

About this graph

Compare the examiner's allowance rates with and without appeals with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Appeals

About this graph

Compare the examiner's relative benefit of receiving an appeal with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

RCEs

Allowance Rate With No RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of RCE

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative RCE Allowance Rates

About this graph

Compare the examiner's allowance rates with and without RCEs with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of RCEs

About this graph

Compare the examiner's relative benefit of obtaining an RCE with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

History

Tenure

Applications Assigned To Examiner

By Filing Year and Current Application Status
About this graph

Shows all filed applications assigned to this examiner, broken down by filing year and the current status of the applications (issued, abandoned, or pending).

Workload

Recently Published Applications

App No. Title Filing Date Status
14395084 Method for Fastening Chips With a Contact Element Onto a Substrate Provided With a Functional Layer Having Openings for the Chip Contact Elements Oct. 17, 2014 Application Undergoing Preexam Processing
14391294 METHOD FOR FORMING TiSiN THIN FILM LAYER BY USING ATOMIC LAYER DEPOSITION Oct. 08, 2014 Docketed New Case - Ready for Examination
14390992 Encapsulant Materials and a Method of Making Thereof Oct. 06, 2014 Docketed New Case - Ready for Examination
14474650 Method for Separating and Transferring Ic Chips Sep. 02, 2014 Response to Non-Final Office Action Entered and Forwarded to Examiner
14464026 Semiconductor Device and Method of Manufacturing Same Aug. 20, 2014 Non Final Action Mailed
14334012 Semiconductor Device and Manufacturing Method Thereof Jul. 17, 2014 Docketed New Case - Ready for Examination
14322298 Semiconductor Devices and Methods of Manufacture Thereof Jul. 02, 2014 Patented Case
14322787 Method for Bonding Semiconductor Substrates Jul. 02, 2014 Non Final Action Mailed
14306718 Substrate Processing Apparatus Jun. 17, 2014 Notice of Allowance Mailed -- Application Received in Office of Publications
14300499 Focus Control Apparatus for Photolithography Jun. 10, 2014 Docketed New Case - Ready for Examination

Timings

Timings

Examiner Timings

Average Number of Days Until...
514 First Rejection
735 First Final Rejection
841 Abandonment
882 Issue

Art Unit Timings (2817)

Average Number of Days Until...
512 First Rejection
719 First Final Rejection
770 Abandonment
818 Issue

USPTO Timings

Average Number of Days Until...
695 First Rejection
947 First Final Rejection
1113 Abandonment
1104 Issue

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