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KILDAY, LISA A

Overview

Summary

Examiner Ninja's Dataset

261 Total Apps
254 Issued
7 Abandoned
0 Pending

Allowance Rates

Overall Allowance Rate

Likelihood of Allowance Based on Examiner's Full USPTO Tenure
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate Before First Final Rejection

Likelihood of Early Allowance
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate After First Final Rejection

Likelihood of Allowance After RCE's, etc.
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Allowance Rates

Click Legend Items to Filter
About this graph

Compare the examiner's allowance rate with the overall allowance rate of the examiner's art unit and the overall allowance rate of the USPTO. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Strategies

Interviews

Allowance Rate With No Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Interview

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Interview Allowance Rates

About this graph

Compare the examiner's allowance rates with and without interviews with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Interviews

About this graph

Compare the examiner's relative benefit of receiving an interview with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Appeals

Allowance Rate With No Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Appeal

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Appeal Allowance Rates

About this graph

Compare the examiner's allowance rates with and without appeals with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Appeals

About this graph

Compare the examiner's relative benefit of receiving an appeal with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

RCEs

Allowance Rate With No RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of RCE

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative RCE Allowance Rates

About this graph

Compare the examiner's allowance rates with and without RCEs with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of RCEs

About this graph

Compare the examiner's relative benefit of obtaining an RCE with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

History

Tenure

Applications Assigned To Examiner

By Filing Year and Current Application Status
About this graph

Shows all filed applications assigned to this examiner, broken down by filing year and the current status of the applications (issued, abandoned, or pending).

Workload

Recently Published Applications

App No. Title Filing Date Status
10800190 Two Stage Etching of Silicon Nitride to Form a Nitride Spacer Mar. 12, 2004 Patented Case
10697335 Method of Manufacturing Semiconductor Device Having Metal Alloy Interconnection That Has Excellent Em Lifetime Oct. 31, 2003 Patented Case
10652635 Trench Filling Process for Preventing Formation of Voids in Trench Aug. 28, 2003 Patented Case
10632636 Semiconductor Device and Method of Providing Regions of Low Substrate Capacitance Aug. 04, 2003 Patented Case
10612941 Method for Fabricating Semiconductor Device Jul. 07, 2003 Patented Case
10431513 Method for Determining a Preceding Wafer Method for Determining a Measuring Wafer and Method for Adjusting the Number of Wafers May. 08, 2003 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
10424105 Method for Fabricating Semiconductor Integrated Circuit Device Apr. 28, 2003 Patented Case
10402109 Insulation Film on Semiconductor Substrate and Method for Forming Same Mar. 27, 2003 Patented Case
10321090 Adaptive Negative Differential Resistance Device Dec. 17, 2002 Patented Case
10314785 Process for Controlling Performance Characteristics of a Negative Differential Resistance (Ndr) Device Dec. 09, 2002 Patented Case

Timings

Timings

Examiner Timings

Average Number of Days Until...
429 First Rejection
771 First Final Rejection
617 Abandonment
765 Issue

Art Unit Timings (2829)

Average Number of Days Until...
522 First Rejection
744 First Final Rejection
881 Abandonment
879 Issue

USPTO Timings

Average Number of Days Until...
695 First Rejection
947 First Final Rejection
1113 Abandonment
1104 Issue

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