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KARLSEN, ERNEST F

Overview

Summary

Examiner Ninja's Dataset

1864 Total Apps
1648 Issued
214 Abandoned
2 Pending

Allowance Rates

Overall Allowance Rate

Likelihood of Allowance Based on Examiner's Full USPTO Tenure
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate Before First Final Rejection

Likelihood of Early Allowance
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate After First Final Rejection

Likelihood of Allowance After RCE's, etc.
About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Allowance Rates

Click Legend Items to Filter
About this graph

Compare the examiner's allowance rate with the overall allowance rate of the examiner's art unit and the overall allowance rate of the USPTO. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Strategies

Interviews

Allowance Rate With No Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Interview

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Interview

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Interview Allowance Rates

About this graph

Compare the examiner's allowance rates with and without interviews with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Interviews

About this graph

Compare the examiner's relative benefit of receiving an interview with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Appeals

Allowance Rate With No Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With Appeal

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of Appeal

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative Appeal Allowance Rates

About this graph

Compare the examiner's allowance rates with and without appeals with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of Appeals

About this graph

Compare the examiner's relative benefit of receiving an appeal with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

RCEs

Allowance Rate With No RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Allowance Rate With RCE

About this graph

The allowance rate is calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Relative Benefit of RCE

About this graph

The relative benefit is calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their lifetime tenure at the USPTO. In the future I plan to implement a filter which provides fine-grained control over this setting, allowing users to specify custom timeframes to look at.

Comparative RCE Allowance Rates

About this graph

Compare the examiner's allowance rates with and without RCEs with the equivalent allowance rates for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All allowance rates are calculated using the total number of applications issued and abandoned as follows:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

Comparative Benefits of RCEs

About this graph

Compare the examiner's relative benefit of obtaining an RCE with the equivalent relative benefit for the examiner's art unit and the USPTO as a whole. If the examiner is known to be a current USPTO employee, the art unit used in the comparison is the examiner's current art unit. If the examiner cannot be identified as a current USPTO employee, the art unit of the examiner's last filed application is used.

All relative benefits are calculated using the allowance rates ("AR"s) with and without the event:

Each examiner's metrics are calculated from all applications assigned to them across their tenure. Art unit and USPTO metrics are calculated from all applications filed in the past 15 years. In the future I plan to implement filters which provide fine-grained control over these settings, allowing users to specify custom timeframes to look at.

History

Tenure

Applications Assigned To Examiner

By Filing Year and Current Application Status
About this graph

Shows all filed applications assigned to this examiner, broken down by filing year and the current status of the applications (issued, abandoned, or pending).

Workload

Recently Published Applications

App No. Title Filing Date Status
10594404 Testing Integrated Circuits Jan. 09, 2009 Abandoned -- Failure to Pay Issue Fee
12255006 Current Sensor Having Field Screening Arrangement Including Electrical Conductors Sandwiching Magnetic Permeability Layer Oct. 21, 2008 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
12255407 Ic Tester Oct. 21, 2008 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
12154304 Structure for Modeling Stress-Induced Degradation of Conductive Interconnects May. 22, 2008 Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
12112782 Synchronous Semiconductor Device, and Inspection System and Method for the Same Apr. 30, 2008 Patented Case
12082048 Semiconductor Device Testing Apparatus and Device Interface Board Apr. 07, 2008 Patented Case
12056000 Apparatus and Method for Detecting Electronic Device Testing Socket Mar. 26, 2008 Patented Case
12079202 Wafer Translator Having Metallization Pattern Providing High Density Interdigitated Contact Pads for Component Mar. 24, 2008 Patented Case
12050204 Heating Apparatus for Semiconductor Devices Mar. 18, 2008 Patented Case
12045480 Assembly for Electrically Connecting a Test Component to a Testing Machine for Testing Electrical Circuits on the Test Component Mar. 10, 2008 Patented Case

Timings

Timings

Examiner Timings

Average Number of Days Until...
402 First Rejection
722 First Final Rejection
738 Abandonment
836 Issue

Art Unit Timings (2829)

Average Number of Days Until...
522 First Rejection
744 First Final Rejection
881 Abandonment
879 Issue

USPTO Timings

Average Number of Days Until...
695 First Rejection
947 First Final Rejection
1113 Abandonment
1104 Issue

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